Band tail state related photoluminescence and photoresponse of ZnMgO solid solution nanostructured films

• Vadim Morari,
• Aida Pantazi,
• Nicolai Curmei,
• Vitalie Postolache,
• Emil V. Rusu,
• Marius Enachescu,
• Ion M. Tiginyanu and
• Veaceslav V. Ursaki

Beilstein J. Nanotechnol. 2020, 11, 899–910, doi:10.3762/bjnano.11.75

• substrate. The composition of the prepared films was determined by energy dispersive X-ray analysis (EDAX). Examples of the elemental composition analysis are presented in Figure 3 for ZnO and Zn0.6Mg0.4O films. The results of measurements demonstrate stoichiometric compositions within limits of the errors

• , and the deposition process lasted for 15 min. The morphology and chemical composition microanalysis of the produced films were studied using a Zeiss Sigma SEM, Hitachi SU 8230, equipped with tools for energy dispersive X-ray analysis (EDAX). Atomic force microscopy (AFM) measurements were performed in

Precursor concentration and temperature controlled formation of polyvinyl alcohol-capped CdSe-quantum dots

• Chetan P. Shah,
• Madhabchandra Rath,
• Manmohan Kumar and
• Parma N. Bajaj

Beilstein J. Nanotechnol. 2010, 1, 119–127, doi:10.3762/bjnano.1.14

• : cadmium selenide; electron microscopy; energy dispersive X-ray analysis (EDAX); semiconductor; Introduction In recent years, the synthesis and characterization of quantum dots and nanoparticles of group II-VI compound semiconductors have generated a great deal of research interest because of their